Reputation and Efficiency: A Nonparametric Assessment of America's Top-Rated MBA Programs
Year of publication: |
2003-03
|
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Authors: | Ray, Subhash C. ; Jeon, Yongil |
Institutions: | Department of Economics, University of Connecticut |
Subject: | Data Envelopment Analysis | Pareto-Koopmans global efficiency | Reputation |
Extent: | application/pdf |
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Series: | |
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | The price is Free Number 2003-13 28 pages |
Classification: | I2 - Education ; D6 - Welfare Economics ; N3 - Labor and Consumers, Demography, Education, Income and Wealth |
Source: |
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