Returns to Scale on Nonparametric Deterministic Technologies: Simplifying Goodness-of-Fit Methods Using Operations on Technologies
Year of publication: |
2000
|
---|---|
Authors: | Briec, Walter ; Kerstens, Kristiaan ; Leleu, Hervé ; Eeckaut, Philippe |
Published in: |
Journal of Productivity Analysis. - Springer. - Vol. 14.2000, 3, p. 267-274
|
Publisher: |
Springer |
Subject: | Returns to scale | DEA | FDH |
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