Robust Tests for Treatment Effects Based on Censored Recurrent Event Data Observed over Multiple Periods
| Year of publication: |
2005
|
|---|---|
| Authors: | Cook, Richard J. ; Wei, Wei ; Yi, Grace Y. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 61.2005, 3, p. 692-701
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010946753