Semi-parametric efficiency bounds for regression models under response-selective sampling: the profile likelihood approach
| Year of publication: |
2010
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|---|---|
| Authors: | Lee, Alan ; Hirose, Yuichi |
| Published in: |
Annals of the Institute of Statistical Mathematics : AISM. - Tōkyō [u.a.], Berlin, Heidelberg : Springer, ISSN 0020-3157, ZDB-ID 3903138. - Vol. 62.2010, 6, p. 1023-1053
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