Semiparametric Quantitative-Trait-Locus Mapping: I. on Functional Growth Curves
Year of publication: |
2004-07-11
|
---|---|
Authors: | Chen, Ying ; Wu, Rongling |
Institutions: | Berkeley Electronic Press |
Subject: | Counting process | family-wise error rate control | functional data | linkage mapping | multiple comparison | repeated measurements |
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