Semiparametric Regression Modeling with Mixtures of Berkson and Classical Error, with Application to Fallout from the Nevada Test Site
| Year of publication: |
2002
|
|---|---|
| Authors: | Mallick, Bani ; Hoffman, F. Owen ; Carroll, Raymond J. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 58.2002, 1, p. 13-20
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| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010946386