Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference

Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference

Yuan, Tao, (2008)

A model-based clustering approach to the recognition of the spatial defect patterns produced during semiconductor fabrication

Yuan, Tao, (2008)

Non-parametric Bayesian modeling of hazard rate with a change point for nanoelectronic devices

Yang, Chia-Han, (2012)