SPC of a Near Zero-defect Process Subject to Random Shocks:
Year of publication: |
1993
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Authors: | Xie, M. ; Goh, T.N. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 9.1993, 2, p. 89-94
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Saved in:
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