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SPECIAL SECTION PAPERS - Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides
Hsieh, M.-H., (2007)
Performance of Parameter-Estimates in Step-Stress Accelerated Life-Tests With Various Sample-Sizes
McSorley, E.O., (2002)
Wavelet-based SPC procedure for complicated functional data
Jeong, M.K., (2006)