Spot Variance Path Estimation and its Application to High Frequency Jump Testing
Year of publication: |
2009
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Authors: | Bos, Charles S. ; Janus, Pawel ; Koopman, Siem Jan |
Publisher: |
Amsterdam and Rotterdam : Tinbergen Institute |
Subject: | high frequency | intraday periodicity | jump testing | leverage effect | microstructure noise | pre-averaged bipower variation | spot variance |
Series: | Tinbergen Institute Discussion Paper ; 09-110/4 |
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Type of publication: | Book / Working Paper |
Type of publication (narrower categories): | Working Paper |
Language: | English |
Other identifiers: | 839166095 [GVK] hdl:10419/86689 [Handle] RePEc:dgr:uvatin:20090110 [RePEc] |
Classification: | C12 - Hypothesis Testing ; C13 - Estimation ; C22 - Time-Series Models ; G10 - General Financial Markets. General ; G14 - Information and Market Efficiency; Event Studies |
Source: |
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Spot Variance Path Estimation and its Application to High Frequency Jump Testing
Bos, Charles S., (2009)
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Spot Variance Path Estimation and its Application to High Frequency Jump Testing
Bos, Charles S., (2009)
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Spot variance path estimation and its application to high frequency jump testing
Bos, Charles S., (2009)
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Spot Variance Path Estimation and its Application to High Frequency Jump Testing
Bos, Charles S., (2009)
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Spot Variance Path Estimation and its Application to High Frequency Jump Testing
Bos, Charles S., (2009)
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