Surface enhanced resonant Raman scattering induced by silver thin films close to the percolation threshold

The electromagnetic field of an incoming wave has already been found to be enhanced close to the surface of a thin granular or rough silver film. We use Surface Enhanced Resonant Raman Scattering (SERRS) as a test of this enhancement close to the percolation threshold (pc). The scattered light shows a maximum below pc, then a minimum close to pc and goes up above.

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Year of publication:	1997
Authors:	Gadenne, Patrice ; Gagnot, Dorothée ; Masson, Michèle
Published in:	Physica A: Statistical Mechanics and its Applications. - Elsevier, ISSN 0378-4371. - Vol. 241.1997, 1, p. 161-165
Publisher:	Elsevier
Subject:	Granular thin films \| Rough surface \| Resonant Raman scattering \| Percolation threshold

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Type of publication:	Article
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10010586970