Technostressors - a boon or bane? : toward an integrative conceptual model
Rofia Ramesh, Subramaniam Ananthram, V. Vijayalakshmi and Piyush Sharma
| Year of publication: |
2022
|
|---|---|
| Authors: | Ramesh, Rofia ; Ananthram, Subramaniam ; Vijayalakshmi, V. ; Sharma, Piyush |
| Published in: |
Journal of Indian business research. - Bradford : Emerald, ISSN 1755-4209, ZDB-ID 2498367-6. - Vol. 14.2022, 3, p. 278-300
|
| Subject: | Job burnout | Mindfulness | Psychological need satisfaction | Techno-complexity | Techno-insecurity | Techno-invasion | Techno-overload | Techno-uncertainty | Technostressors | Work engagement | Arbeitspsychologie | Organizational psychology | Arbeitszufriedenheit | Job satisfaction | Leistungsmotivation | Work motivation | Burnout |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1108/JIBR-10-2021-0348 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10013288114