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TESTING FOR LONG MEMORY

Year of publication:
2008
Authors: Harris, David ; Mccabe, Brendan ; Leybourne, Stephen ; Brockwell, P.J. ; Davis, R. ; Delgado, M.A. ; Robinson, P.M. ; Hannan, E.J. ; Hobijn, B. ; Franses, P.H. ; Ooms, M. ; Kwiatkowski, D. ; Phillips, P.C.B. ; Schmidt, P. ; Shin, Y. ; Lee, D. ; Schmidt, P. ; Lobato, I.N. ; Robinson, P.M.
Published in:
Econometric theory. - Cambridge : Cambridge Univ. Press, ISSN 0266-4666, ZDB-ID 9016612. - Vol. 24.2008, 1, p. 143-175
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Type of publication: Article
Source:
OLC-SSG Economic Sciences
Persistent link: https://www.econbiz.de/10007896790
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