Tests for location-scale families based on the empirical characteristic function
| Year of publication: |
2005
|
|---|---|
| Authors: | Epps, T.W. |
| Published in: |
Metrika. - Springer. - Vol. 62.2005, 1, p. 99-114
|
| Publisher: |
Springer |
| Subject: | Anderson-Darling test | Cauchy distribution | Exponential distribution | Extreme-value distribution | Goodness-of-fit test | Laplace distribution | Logistic distribution | Normal distribution | Uniform distribution | Weibull distribution |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10005598559