Tests of Short Memory With Thick-Tailed Errors
| Year of publication: |
2012
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|---|---|
| Authors: | Amsler, Christine ; Schmidt, Peter |
| Published in: |
Journal of business & economic statistics : JBES ; a publication of the American Statistical Association. - Alexandria, Va : American Statistical Association, ISSN 0735-0015, ZDB-ID 876122x. - Vol. 30.2012, 3 (1.7.), p. 381-391
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