The [alpha]-reliable mean-excess regret model for stochastic facility location modeling
| Year of publication: |
2006
|
|---|---|
| Authors: | Chen, Gang ; Daskin, Mark S. ; Shen, Zuo-Jun Max ; Uryasev, Stanislav |
| Published in: |
Naval research logistics : an international journal. - New York, NY : Wiley, ISSN 0894-069X, ZDB-ID 3924944. - Vol. 53.2006, 7, p. 617-626
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