THE CASE FOR STANDARD MEASURES OF PATENT QUALITY
| Year of publication: |
2012
|
|---|---|
| Authors: | Kappos, David J ; Graham, Stuart |
| Published in: |
MIT sloan management review. - Cambridge, Mass : MIT, ISSN 1532-9194, ZDB-ID 2039388X. - Vol. 53.2012, 3, p. 19-25
|