The effectiveness study of Double Sampling s charts application on destructive testing process
Pei-Hsi Lee; Chau-Chen Torng, Jhih-Cyuan Wu and Chun-Chieh Tseng
| Year of publication: |
2010
|
|---|---|
| Authors: | Lee, Pei-hsi ; Torng, Chau-chen ; Wu, Jhih-cyuan ; Tseng, Chun-chieh |
| Published in: |
International journal of product development : IJPD. - Olney, Bucks : Inderscience Enterprises, ISSN 1477-9056, ZDB-ID 2164924-8. - Vol. 12.2010, 3/4, p. 324-335
|
| Subject: | Statistische Qualitätskontrolle | Statistical quality control | Stichprobenerhebung | Sampling | Halbleiterindustrie | Semiconductor industry |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10008758369