The R&D value-chain efficiency measurement for high-tech industries in China
Year of publication: |
2012
|
---|---|
Authors: | Chiu, Yung-ho ; Huang, Chin-wei ; Chen, Yu-Chuan |
Published in: |
Asia Pacific Journal of Management. - Springer, ISSN 0217-4561. - Vol. 29.2012, 4, p. 989-1006
|
Publisher: |
Springer |
Subject: | Data envelopment analysis | R&D efficiency | Operation efficiency | Value-chain framework | two-stage model | Patents | China |
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