The Relationship of the Degree of Exposure to a Technological Disaster and Emotional Response: A Structural Model Approach
| Year of publication: |
2001
|
|---|---|
| Authors: | Esparcia, Adolfo ; Olmos, Joan Guárdia |
| Published in: |
Quality & Quantity: International Journal of Methodology. - Springer. - Vol. 35.2001, 2, p. 161-171
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| Publisher: |
Springer |
| Subject: | Post-traumatic stress disorder | technological disaster | depression | structural models |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10009391295