Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers
Year of publication: |
2008
|
---|---|
Authors: | Maury, H. ; Jonnard, P. ; Guen, K. ; André, J. ; Wang, Z. ; Zhu, J. ; Dong, J. ; Zhang, Z. ; Bridou, F. ; Delmotte, F. ; Hecquet, C. ; Mahne, N. ; Giglia, A. ; Nannarone, S. |
Published in: |
The European Physical Journal B - Condensed Matter and Complex Systems. - Springer. - Vol. 64.2008, 2, p. 193-199
|
Publisher: |
Springer |
Subject: | 68.65.Ac Multilayers | 61.05.cm X-ray reflectometry (surfaces | interfaces | films) | 78.70.En X-ray emission spectra and fluorescence | 73.90.+f Other topics in electronic structure and electrical properties of surfaces | thin films | and low-dimensional structures | 66.30.Ny Chemical interdiffusion | diffusion barriers | 68.35.Fx Diffusion | interface formation |
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