Towards a knowledge-based scheduling system for semiconductor testing
| Year of publication: |
1998
|
|---|---|
| Authors: | De, S. ; Lee, A. |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 36.1998, 4, p. 1045-1074
|