True sparse PCA for reducing the number of essential sensors in virtual metrology
Yifan Xie, Tianhui Wang, Young-Seon Jeong, Ali Tosyali and Myong K. Jeong
| Year of publication: |
2024
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|---|---|
| Authors: | Xie, Yifan ; Wang, Tianhui ; Jeong, Young-Seon ; Tosyali, Ali ; Jeong, Myong Kee |
| Published in: |
International journal of production research. - London [u.a.] : Taylor & Francis, ISSN 1366-588X, ZDB-ID 1485085-0. - Vol. 62.2024, 6, p. 2142-2157
|
| Subject: | feature extraction | principal component | sensors reduction | sparsity | Virtual metrology |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1080/00207543.2023.2217282 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10014546369