Using Accelerated Life Tests Results to Predict Product Field Reliability
| Year of publication: |
2009
|
|---|---|
| Authors: | Meeker, William Q. ; Escobar, Luis A. ; Hong, Yili |
| Published in: |
Journal of quality technology : a quarterly journal of methods, applications and related topics. - Milwaukee, Wis. : ASQ, ISSN 0022-4065, ZDB-ID 4105126. - Vol. 41.2009, 3, p. 146-161
|