Using bifactor models to identify faking on Big Five questionnaires
| Year of publication: |
2020
|
|---|---|
| Authors: | Hendy, Nhung ; Krammer, Georg ; Schermer, Julie Aitken ; Biderman, Michael D. |
| Published in: |
International Journal of Selection and Assessment. - Wiley, ISSN 1468-2389, ZDB-ID 2027700-3. - Vol. 29.2020, 1 (22.11.), p. 81-99
|
| Publisher: |
Wiley |
| Type of publication: | Article |
|---|---|
| Language: | English |
| Other identifiers: | 10.1111/ijsa.12316 [DOI] |
| Source: | Other ZBW resources |
Persistent link: https://www.econbiz.de/10012409169