Using neural networks to detect the bivariate process variance shifts pattern
Year of publication: |
2011
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Authors: | Cheng, Chuen-Sheng ; Cheng, Hui-Ping |
Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 60.2011, 2, p. 269-279
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