Using the American community survey to create a national academy of sciences-style poverty measure : work by the New York City Center for Economic Opportunity
Year of publication: |
2010
|
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Authors: | Levitan, Mark ; D'Onofrio, Christine ; Koolwal, Gayatri ; Krampner, John ; Scheer, Daniel |
Published in: |
Journal of policy analysis and management : the journal of the Association for Public Policy Analysis and Management. - Hoboken, NJ : Wiley-Blackwell, ISSN 0276-8739, ZDB-ID 797148-5. - Vol. 29.2010, 2, p. 373-386
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Subject: | Armut | Poverty | Messung | Measurement | Datenerhebung | Data collection | Armutsbekämpfung | Poverty reduction | New York | USA | United States |
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