Validierung von Konzepten zur Messung des Marktrisikos: Insbesondere des Value at Risk und des Expected Shortfall
Year of publication: |
2012
|
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Authors: | Mehmke, Fabian ; Cremers, Heinz ; Packham, Natalie |
Institutions: | Frankfurt School of Finance and Management |
Subject: | Backtesting | Market Risk | Value at Risk | Expected Shortfall | Validation | Alpha Error | Beta Error | Time Until First Failure | Proportion of Failure | Traffic Light Approach | Magnitude of Loss Function | Markow-Test | Gauss-Test | Rosenblatt | Kuiper | Kolmogorov-Smirnov | Jarque-Bera | Regression | Likelihood Ratio | Truncated Distribution | Censored Distribution | Simulation |
Extent: | application/pdf |
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Series: | Frankfurt School - Working Paper Series. - ISSN 1436-9753. |
Type of publication: | Book / Working Paper |
Notes: | Number 192 |
Classification: | C01 - Econometrics ; C02 - Mathematical Methods ; C12 - Hypothesis Testing ; C13 - Estimation ; C14 - Semiparametric and Nonparametric Methods ; C15 - Statistical Simulation Methods; Monte Carlo Methods ; C32 - Time-Series Models ; G32 - Financing Policy; Capital and Ownership Structure ; G38 - Government Policy and Regulation |
Source: |
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Mehmke, Fabian, (2012)
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