Why weak patents? : testing the examiner ignorance hypothesis
Zhen Lei, Brian D. Wright
| Year of publication: |
April 2017
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|---|---|
| Authors: | Lei, Zhen ; Wright, Brian D. |
| Published in: |
Journal of public economics. - Amsterdam [u.a.] : Elsevier, ISSN 0047-2727, ZDB-ID 183995-0. - Vol. 148.2017, p. 43-56
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| Subject: | Patent office | Patent quality | Patent examiner | Weak patent | Intellectual property | Patent | Patentrecht | Patent law | Immaterialgüterrechte | Intellectual property rights | Innovation | Theorie | Theory |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.jpubeco.2017.02.004 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10011823539