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language:"eng"
subject:"Technological change"
~person:"Bound, John"
~subject:"Panel study"
~type_genre:"Aufsatz in Zeitschrift"
~type_genre:"Working Paper"
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Bound, John
Afonso, António
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Lee, Chien-chiang
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8
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Implications of skill-biased technological change : international evidence
Berman, Eli
;
Bound, John
;
Machin, Stephen
- In:
The quarterly journal of economics
113
(
1998
)
4
,
pp. 1245-1279
Persistent link: https://www.econbiz.de/10001368905
Saved in:
2
Implications of skill-biased technological change : international evidence
Berman, Eli
;
Bound, John
;
Machin, Stephen
-
1997
Persistent link: https://www.econbiz.de/10000640172
Saved in:
3
Implications of skill-biased technological change : international evidence
Berman, Eli
;
Bound, John
;
Machin, Stephen
-
1997
Persistent link: https://www.econbiz.de/10000970114
Saved in:
4
Implications of skill-biased technological change : international evidence
Berman, Eli
;
Bound, John
;
Machin, Stephen
-
1997
Persistent link: https://www.econbiz.de/10000970989
Saved in:
5
Implications of skill-biased technological change : international evidence
Berman, Eli
;
Bound, John
;
Machin, Stephen
-
1997
Persistent link: https://www.econbiz.de/10000981289
Saved in:
6
Implications of skill-biased technological change : international evidence
Berman, Eli
;
Machin, Stephen
;
Bound, John
-
1996
Persistent link: https://www.econbiz.de/10000961090
Saved in:
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