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subject:"United States"
type_genre:"Article in journal"
~isPartOf:"Journal of applied econometrics"
~isPartOf:"Review / Federal Reserve Bank of St. Louis"
~person:"Giot, Pierre"
~subject:"Bank"
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Journal of applied econometrics
Review / Federal Reserve Bank of St. Louis
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Value-at-risk for long and short trading positions
Giot, Pierre
;
Laurent, Sébastien
- In:
Journal of applied econometrics
18
(
2003
)
6
,
pp. 641-664
Persistent link: https://www.econbiz.de/10001843499
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