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~institution:"Center for Economic Research <Tilburg>"
~institution:"Federal Reserve Bank of New York"
~person:"Duyn Schouten, Frank A. van der"
~subject:"Statistische Verteilung"
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Duyn Schouten, Frank A. van der
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Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution
Bar-Lev, Shaul K.
(
contributor
); …
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2003
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[Elektronische Ressource]
Persistent link: https://www.econbiz.de/10001796269
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