Bergstrand, Jeffrey H.; Baier, Scott L. - In: Aussenwirtschaft 65 (2010) 3, pp. 239-250
-parametric "matching" statistical estimation technique of BAIER and BERGSTRAND (2009), using methods developed by ABADIE and IMBENS (2006 … parametric panel techniques and with those in BAIER and BERGSTRAND (2009) using matching econometrics that the likely impact of …