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~isPartOf:"Economics letters"
~person:"Chow, William W."
~subject:"United States"
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Measuring the intensity of knowledge flow with patent statistics
Fung, Michael Ka-yiu
;
Chow, William W.
- In:
Economics letters
74
(
2002
)
3
,
pp. 353-358
Persistent link: https://www.econbiz.de/10001654082
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