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~isPartOf:"IEEE transactions on engineering management : EM"
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Search: subject_exact:"Electronics industry"
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IEEE transactions on engineering management : EM
International journal of technology management : IJTM
22
Asia Pacific business review
16
Technological forecasting & social change : an international journal
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World development : the multi-disciplinary international journal devoted to the study and promotion of world development
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1
Novel single-valued neutrosophic combined compromise solution approach for sustainable waste electrical and electronics equipment recycling partner selection
Rani, Pratibha
;
Mishra, Arunodaya Raj
- In:
IEEE transactions on engineering management : EM
69
(
2022
)
6,1
,
pp. 3139-3153
Persistent link: https://www.econbiz.de/10013542871
Saved in:
2
Exploring standard dynamics in electronics industry : focusing on influencing factors and revision of IEC standards
Moon, Seungyeon
;
Lee, Heesang
- In:
IEEE transactions on engineering management : EM
69
(
2022
)
4
,
pp. 1365-1377
Persistent link: https://www.econbiz.de/10013356950
Saved in:
3
The changing patterns of knowledge production of catch-up firms during the forging-ahead period : case study of Samsung Electronics Co. (SEC)
Seo, Eun-Yeong
;
Choung, Jae-Yong
;
Hwang, Hye-Ran
- In:
IEEE transactions on engineering management : EM
66
(
2019
)
4
,
pp. 621-635
Persistent link: https://www.econbiz.de/10012129915
Saved in:
4
Supply network structure and firm performance : evidence from the electronics industry
Basole, Rahul C.
;
Ghosh, Soumen
;
Hora, Manpreet S.
- In:
IEEE transactions on engineering management : EM
65
(
2018
)
1
,
pp. 141-154
Persistent link: https://www.econbiz.de/10011806724
Saved in:
5
An extended fuzzy-AHP approach for the evaluation of green product designs
Chan, Hing Kai
;
Wang, Xiaojun
;
White, Gareth Reginald …
- In:
IEEE transactions on engineering management : EM
60
(
2013
)
2
,
pp. 327-339
Persistent link: https://www.econbiz.de/10009753797
Saved in:
6
Path dependence and the incumbents' s survival in cross industries under radical circumstances : lessons from the Samsung case
Park, Tae-young
- In:
IEEE transactions on engineering management : EM
58
(
2011
)
1
,
pp. 154-164
Persistent link: https://www.econbiz.de/10008938493
Saved in:
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