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~isPartOf:"Innovation and firm performance : econometric explorations of survey data"
~subject:"Kausalanalyse"
~type_genre:"Book section"
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Innovation and firm performance : econometric explorations of survey data
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The mutual relation between patents and R&D
Ophem, Hans van
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- In:
Innovation and firm performance : econometric …
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(pp. 56-70)
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2002
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