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~isPartOf:"International journal of product development : IJPD"
~person:"Gawer, Annabelle"
~person:"Jin, Tongdan"
~subject:"Electronic component"
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Risk-averse reliability optimisation in electronic product design with component and non-component failures
Jin, Tongdan
;
Liao, Haitao
;
Wang, Peng
- In:
International journal of product development : IJPD
5
(
2008
)
1/2
,
pp. 93-108
Persistent link: https://www.econbiz.de/10003642561
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