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~isPartOf:"Journal of Econometrics"
~person:"Agiakloglou, Christos N."
~person:"Leybourne, Stephen"
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Leybourne, Stephen
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Unit root tests with a break in innovation variance
Kim, Tae-Hwan
;
Leybourne, Stephen
;
Newbold, Paul
- In:
Journal of Econometrics
109
(
2002
)
2
,
pp. 365-387
Persistent link: https://www.econbiz.de/10005228670
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