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~isPartOf:"Journal of organizational behavior : OB ; the internat. journal of industrial, occupational and organizational psychology and behavior"
~subject:"Team"
~type_genre:"Bibliography included"
~type_genre:"Fallstudie"
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Journal of organizational behavior : OB ; the internat. journal of industrial, occupational and organizational psychology and behavior
Global business and organizational excellence : a review of research & best practices
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Sociometric badges : using sensor technology to capture new forms of collaboration
Kim, Taemie
;
McFee, Erin
;
Olguin, Daniel Olguin
;
Waber, Ben
- In:
Journal of organizational behavior : OB ; the internat. …
33
(
2012
)
3
,
pp. 412-427
Persistent link: https://www.econbiz.de/10009522354
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