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~isPartOf:"MSI"
~language:"eng"
~person:"Van Looy, Baart"
~subject:"EU-Staaten"
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Patent citation indicators : one size fits all?
Bakker, Jurriën
;
Verhoeven, Dennis
;
Zhang, Lin
;
Van …
-
2016
Persistent link: https://www.econbiz.de/10011527459
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