AMIRHOSEINY, M.; HASSAN, Z.; NG, S. S.; ALAHYARIZADEH, G. - In: Surface Review and Letters (SRL) 20 (2013) 01, pp. 1350008-1
The structure and optical properties of InN thin film grown on 6H-SiC by reactive radio frequency magnetron sputtering were investigated. X-ray diffraction measurement shows that the deposited InN film has (101) preferred growth orientation and wurtzite structure. Atomic force microscopy results...