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~person:"Chien, Chen-Fu"
~type_genre:"Article in journal"
~type_genre:"Handbook"
~type_genre:"Handbuch"
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International journal of manufacturing technology and management
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OR spectrum : quantitative approaches in management
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Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework
Chien, Chen-Fu
;
Hu, Chih-Han
;
Lin, Chi-Yung
- In:
International journal of manufacturing technology and …
14
(
2008
)
1/2
,
pp. 130-144
Persistent link: https://www.econbiz.de/10003691544
Saved in:
2
Special issue on OR in the electronics industry
Chien, Chen-Fu
(
contributor
)
-
2008
Persistent link: https://www.econbiz.de/10003710560
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