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~person:"Graneri, Jorge"
~person:"Kim, Byunghoon"
~subject:"Decision under uncertainty"
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Decision under uncertainty
Decision tree
2
Entscheidung unter Unsicherheit
2
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Binary decision tree
1
Classification
1
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semiconductor wafer
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uncertain data classification
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Graneri, Jorge
Kim, Byunghoon
Bioch, Jan C.
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European journal of operational research : EJOR
1
International journal of production research
1
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ECONIS (ZBW)
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A generalised uncertain decision tree for defect classification of multiple wafer maps
Kim, Byunghoon
;
Jeong, Young-Seon
;
Tong, Seung Hoon
; …
- In:
International journal of production research
58
(
2020
)
9
,
pp. 2805-2821
Persistent link: https://www.econbiz.de/10012265272
Saved in:
2
A multi-tree committee to assist port-of-entry inspection decisions
Romero, Pablo
;
Graneri, Jorge
;
Viera, Omar
;
Moscatelli, …
- In:
European journal of operational research : EJOR
253
(
2016
)
1
,
pp. 170-177
Persistent link: https://www.econbiz.de/10011477412
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