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Groeseneken, G.
2
Maes, H.E.
2
Egger, P.
1
Faraone, L.
1
Gieser, H.
1
Guggenmos, X.
1
Houdt, J.Van
1
Kuper, F.G.
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Maes, H.
1
Roussel, P.J.
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Russ, C.
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Verhaege, K.
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Wellekens, D.
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Quality and reliability engineering international
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OLC EcoSci
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1
Write-Erase Degradation and Disturb Effects in Source-side Injection Flash EEPROM Devices
Wellekens, D.
;
Houdt, J.Van
;
Groeseneken, G.
;
Maes, H.
; …
- In:
Quality and reliability engineering international
11
(
1995
)
4
,
pp. 239-246
Persistent link: https://www.econbiz.de/10006404885
Saved in:
2
Analysis of HBM ESD Testers and Specifications using a Fourth-order Lumped Element Model
Verhaege, K.
;
Roussel, P.J.
;
Groeseneken, G.
;
Maes, H.E.
; …
- In:
Quality and reliability engineering international
10
(
1994
)
4
,
pp. 325-334
Persistent link: https://www.econbiz.de/10006408719
Saved in:
3
Special Report: Survey of the Present Status on Critical Reliability Issues within Europe:
Maes, H.E.
- In:
Quality and reliability engineering international
9
(
1993
)
2
,
pp. 83-84
Persistent link: https://www.econbiz.de/10006413463
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