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Search: isPartOf:"Annals of the Institute of Statistical Mathematics"
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Asymptotic normality
28
Bootstrap
26
Edgeworth expansion
22
Nonparametric regression
21
order statistics
21
consistency
19
exponential distribution
19
Empirical likelihood
18
asymptotic normality
18
Markov chain
17
maximum likelihood estimator
17
probability generating function
17
Maximum likelihood estimation
15
Consistency
14
M-estimator
14
Probability generating function
14
exponential family
14
nonparametric regression
14
maximum likelihood estimation
13
AIC
12
Asymptotic expansion
12
EM algorithm
12
Poisson process
12
Robustness
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central limit theorem
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model selection
12
Markov chain Monte Carlo
11
regression
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Fisher information
10
Model selection
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Order statistics
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bootstrap
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likelihood ratio test
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robustness
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waiting time
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Bandwidth
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Censored data
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Aki, Sigeo
48
Balakrishnan, N.
46
Dette, Holger
27
Takemura, Akimichi
22
Hirano, Katuomi
21
Akahira, Masafumi
17
Inoue, Kiyoshi
17
Sibuya, Masaaki
16
Bouzar, Nadjib
15
Honda, Toshio
15
Konishi, Sadanori
15
Sun, Dongchu
15
Beran, Rudolf
14
Kitagawa, Genshiro
14
Mukerjee, Rahul
14
Yoshida, Nakahiro
14
Akaike, Hirotugu
13
Nishiyama, Yoichi
13
Ebrahimi, Nader
12
Bolfarine, Heleno
11
Ogata, Yosihiko
11
Wang, Qi-Hua
11
Doucet, Arnaud
10
Fujikoshi, Yasunori
10
Inagaki, Nobuo
10
Lee, Sangyeol
10
Bose, Arup
9
Chiang, Chin-Tsang
9
Cramer, Erhard
9
Fu, James
9
Gupta, Ramesh
9
Kuriki, Satoshi
9
Uchida, Masayuki
9
Aoki, Satoshi
8
Falk, Michael
8
Gupta, Arjun K.
8
Gupta, Ramesh C.
8
Hall, Peter
8
Hu, Chin-Yuan
8
Hwang, Tea-Yuan
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Annals of the Institute of Statistical Mathematics
1,669
Annals of the Institute of Statistical Mathematics : AISM
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741
Local c- and E-optimal Designs for Exponential Regression Models
Dette, Holger
;
Melas, Viatcheslav
;
Pepelyshev, Andrey
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
2
,
pp. 407-426
Persistent link: https://www.econbiz.de/10005616084
Saved in:
742
On Estimating the Cumulant Generating Function of Linear Processes
Ghosh, Sucharita
;
Beran, Jan
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
1
,
pp. 53-71
Persistent link: https://www.econbiz.de/10005616089
Saved in:
743
Large deviations for M-estimators
Arcones, Miguel
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
1
,
pp. 21-52
Persistent link: https://www.econbiz.de/10005616108
Saved in:
744
Compound Binomial Approximations
Čekanavičius, Vydas
;
Roos, Bero
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
1
,
pp. 187-210
Persistent link: https://www.econbiz.de/10005616109
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745
Joint distributions of runs in a sequence of higher-order two-state Markov trials
Kotwal, K.
;
Shinde, R.
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
3
,
pp. 537-554
Persistent link: https://www.econbiz.de/10005616126
Saved in:
746
A J-Function for Marked Point Patterns
Lieshout, M.
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
2
,
pp. 235-259
Persistent link: https://www.econbiz.de/10005616133
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747
Testing Homogeneity in Weibull Error in Variables Models
Valença, Dione
;
Bolfarine, Heleno
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
1
,
pp. 115-129
Persistent link: https://www.econbiz.de/10005616203
Saved in:
748
A Partial Empirical Likelihood Based Score Test Under a Semiparametric Finite Mixture Model
Zhang, Biao
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
4
,
pp. 707-719
Persistent link: https://www.econbiz.de/10005616234
Saved in:
749
Asymptotic Results on a General Class of Empirical Statistics: Power and Confidence Interval Properties
Chang, In
;
Mukerjee, Rahul
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
3
,
pp. 427-440
Persistent link: https://www.econbiz.de/10005616248
Saved in:
750
Estimation of a Location Parameter with Restrictions or “vague information” for Spherically Symmetric Distributions
Fourdrinier, Dominique
;
Strawderman, William
;
Wells, Martin
- In:
Annals of the Institute of Statistical Mathematics
58
(
2006
)
1
,
pp. 73-92
Persistent link: https://www.econbiz.de/10005616275
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