van Erkelens, H.; van Leeuwen, W.A. - In: Physica A: Statistical Mechanics and its Applications 89 (1977) 2, pp. 225-244
The linear or phenomenological laws such as Ohm's law, Fourier's law and Fick's law are derived for a relativistic plasma in an electromagnetic field. It is shown that the choice of a reference frame as proposed by Landau and Lifshitz entails-in contrast to, for instance, the choice of...