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Subject
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Exponential Distribution 6 Maximum Likelihood Estimation 5 Optimization 5 Statistical Process Control 5 Average Run Length 4 Parametric regression 4 Reliability 4 Survival times 4 Weibull Distribution 4 reliability 4 Bivariate Weibull model 3 Branching Processes 3 Characterizations 3 Entropy 3 Estimation 3 Process Capability Index 3 Target Value 3 Acceptance Sampling Plan 2 Adaptive control chart 2 Asymptotics 2 Average run length 2 Average time to signal 2 Bayesian Reliability 2 Consumer’s Risk 2 Control Chart 2 Copula Function 2 Cumulative Entropy 2 Double Acceptance Sampling Plan 2 Economic Design 2 Electricity Price 2 Extropy 2 Gamma Distribution 2 Gibbs Sampling 2 Gini Index 2 Hazard Rate 2 Lindley Distribution 2 Operational probability 2 Order Statistics 2 Queues 2 Reliability Test Plan 2
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Undetermined 193 Free 16 CC license 1
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Article 209
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research-article 165 frontmatter 7 brief-report 2 review-article 2 editorial 1 miscellaneous 1 other 1
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Language
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English 179 Undetermined 30
Author
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von Collani, Elart 13 Moustafa, Magdi S. 6 Nadarajah, Saralees 6 Chen, Chung-Ho 5 Hanagal, David D. 5 Govindaraju, K. 4 Ho, Linda Lee 4 Kantam, R. R. L. 4 Sans, Wolfgang 4 Agarwal, Manju 3 Chou, Chao-Yu 3 Dey, Sanku 3 Dumitrescu, Monica 3 Gadre, M. P. 3 Ghosh, Indranil 3 Gildeh, Bahram Sadeghpour 3 Jose, K. K. 3 Morais, Manuel Cabral 3 Rattihalli, R. N. 3 Sen, Surath 3 Yousof, Haitham M. 3 Agnihothram, G. 2 Ahsanullah, Mohammad 2 Anis, M. Z. 2 Arulmozhi, G. 2 Baur, Karl 2 Das, Nandini 2 Das, Prasun 2 Demetrescu, Matei 2 Ferger, Dietmar 2 Guo, R. 2 Gutierrez, Abraham 2 Hajeeh, Mohammed 2 Heike, Hans-Dieter 2 Jose, Joby K. 2 Kolev, Nikolai 2 Kotz, Samuel 2 Kumar, Devendra 2 Lai, C. D. 2 Lee Ho, Linda 2
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Stochastics and Quality Control 209
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Other ZBW resources 209
Showing 171 - 180 of 209
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A Problem Called ISO 2859-1 Sampling Procedures for Inspection by Attributes - Part 1
von Collani, Elart - In: Stochastics and Quality Control 19 (2004) 2, pp. 265-276
Abstract Controlling uncertainty has an ever-increasing importance in all areas of industry. To meet the demand, the International Organisation of Standardization (ISO) developed and develops “statistical” standards. However, while success and failure of technical standards can be assessed...
Persistent link: https://www.econbiz.de/10014590771
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Stochastic Methods for Production Processes
von Collani, Elart; Dumitrescu, Monica - In: Stochastics and Quality Control 19 (2004) 1, pp. 61-82
Abstract In [v. Collani, Theoretical Stochastics, Heldermann Verlag, 2004] and [v. Collani, Empirical Stochastics, Heldermann Verlag, 2004] Stochastics, the Science of Prediction is re-established, its basic concepts are developed and fundamental stochastic procedures are introduced. Stochastics...
Persistent link: https://www.econbiz.de/10014590774
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Economic Design of A Dynamic CCC – r Chart for High-Yield Processes
Kudo, Kazuki; Ohta, Hiroshi; Kusukawa, Etsuko - In: Stochastics and Quality Control 19 (2004) 1, pp. 7-21
Abstract Recently, Ohta et al. [Quality and Reliability Engineering International 17: 439-446, 2001] have studied the economic design of CCC (Cumulative Count of Conforming)- r charts for high-yield processes assuming a fixed hazard rate. Generally, however, the hazard rate is varying over time....
Persistent link: https://www.econbiz.de/10014590775
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A Note on Savings in Experimental Time Under Type II Censoring
Kantam, R. R. L.; Rao, G. Srinivasa - In: Stochastics and Quality Control 19 (2004) 1, pp. 91-95
Abstract In reliability analysis, it is preferable to complete an experiment of data collection in a short time due to constraints concerning energy, money or other resources. In this paper we propose a relative measure called relative expected experimental time (REET) for a life testing...
Persistent link: https://www.econbiz.de/10014590777
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Nonparametric Capability Indices
Ramanathan, T. V.; Dharmadhikari, A. D.; Abraham, Bovas - In: Stochastics and Quality Control 18 (2003) 1, pp. 31-41
Abstract Process capability indices C p and C pk are widely used in statistical quality control to assess the capability of a process. These indices are defined, based on the assumption that the quality characteristic follows a normal distribution. In this paper two new capability indices are...
Persistent link: https://www.econbiz.de/10014590749
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Statistical Inference from Boyles' Capability Index
Ho, Linda Lee - In: Stochastics and Quality Control 18 (2003) 1, pp. 43-57
Abstract This paper presents statistical inference procedures from S pn , a process capability index for asymmetrical processes proposed by Boyles. From the frequentist perspective, a conservative lower confidence bound is given. From the Bayesian perspective, the SIR algorithm is used to obtain...
Persistent link: https://www.econbiz.de/10014590750
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On the Distribution of the Estimated Process Capability Index C pmk
Pearn, W. L.; Lin, G. H.; Chang, C. S. - In: Stochastics and Quality Control 18 (2003) 1, pp. 5-30
Abstract Pearn et al. (Kotz and Johnson, Journal of Quality Technology 24: 216–233, 1992) proposed the process capability index C pmk , and investigated the statistical properties of the natural estimator for stable normal processes with constant mean μ . Chen and Hsu (Communications in...
Persistent link: https://www.econbiz.de/10014590752
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A Note on the Murthy-Sarma Estimators of the Mean of the Normal Distribution for Small Samples
Anis, M. Z.; Pandey, R. J. - In: Stochastics and Quality Control 18 (2003) 1, pp. 83-90
Abstract Murthy and Sarma (Assam Statistical Review 12: 1–5, 1998) proposed and studied two biased estimators for the expectation of the normal distribution N ( μ , σ 2 ) when the coefficient of variation is known and is given by . Their estimators for small samples were found to be...
Persistent link: https://www.econbiz.de/10014590754
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Charts for Detecting Small Shifts
Sivasamy, R.; Jayanthi, S. - In: Stochastics and Quality Control 18 (2003) 1, pp. 91-100
Abstract Some recent studies have proved that charts with variable sample size ( VSS ) detect moderate or larger shifts in normal and stable processes more quickly than the Standard Shewhart ( SS ) chart. But the statistical efficiency of charts, the speed at which they detect smaller shifts of...
Persistent link: https://www.econbiz.de/10014590755
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False Alarm Probability Function of Cusum Charts
Nishina, Ken; Nishiyuki, Shintaro - In: Stochastics and Quality Control 18 (2003) 1, pp. 101-112
Abstract In this paper, standard Cusum charts with head start value zero are compared with fast initial response (FIR) Cusum charts proposed by Lucas and Crosier (Technometrics 24: 199–205, 1982) from the viewpoint of the false alarm probability function. The focus in this comparison is...
Persistent link: https://www.econbiz.de/10014590739
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