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Nelson, Lloyd S.
46
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40
Woodall, William H.
24
Reynolds Jr, Marion R.
18
Runger, George C.
18
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14
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14
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11
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9
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9
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6
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6
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Journal of quality technology : a quarterly journal of methods, applications and related topics
927
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OLC EcoSci
927
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1
More Pitfalls of Accelerated Tests
Meeker, William Q
;
Sarakakis, Georgios
; …
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 213-222
Persistent link: https://www.econbiz.de/10010157754
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2
Discussion - More Pitfalls of Accelerated Tests
Doganaksoy, Necip
;
Hall, David B
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 223-225
Persistent link: https://www.econbiz.de/10010157755
Saved in:
3
Discussion - More Pitfalls of Accelerated Tests
Hahn, Gerald J
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 226-230
Persistent link: https://www.econbiz.de/10010157756
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4
Discussion - More Pitfalls of Accelerated Tests
Kugler, Danny L
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 231-231
Persistent link: https://www.econbiz.de/10010157757
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5
Discussion - More Pitfalls of Accelerated Tests
Lawless, Jerry
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 232-232
Persistent link: https://www.econbiz.de/10010157758
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6
Discussion - More Pitfalls of Accelerated Tests
Pan, Rong
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 233-235
Persistent link: https://www.econbiz.de/10010157759
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7
Discussion - More Pitfalls of Accelerated Tests
Trindade, David C
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 236-237
Persistent link: https://www.econbiz.de/10010157760
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8
Discussion - More Pitfalls of Accelerated Tests
Vander Wiel, Scott
;
Weaver, Brian P
;
Stepan, Thomas
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 238-239
Persistent link: https://www.econbiz.de/10010157761
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9
Rejoinder - More Pitfalls of Accelerated Tests
Meeker, William Q
;
Sarakakis, Georgios
; …
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 240-243
Persistent link: https://www.econbiz.de/10010157762
Saved in:
10
Accelerated Test Methods for Reliability Prediction
Collins, David H
;
Freels, Jason K
;
Huzurbazar, Aparna V
; …
- In:
Journal of quality technology : a quarterly journal of …
45
(
2013
)
3
,
pp. 244-259
Persistent link: https://www.econbiz.de/10010157763
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