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~isPartOf:"IEEE transactions on reliability : R ; IEEE T R"
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IEEE transactions on reliability : R ; IEEE T R
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers
6
IIE transactions / Institute of Industrial Engineers, Norcross, Ga : industrial engineering and development
3
European journal of operational research : EJOR
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Circuit Component Degradation - A Generalized SSI Reliability Model Considering Stochastic Loading and Strength Aging Degradation
Huang, W.
;
Askin, R.G.
- In:
IEEE transactions on reliability : R ; IEEE T R
53
(
2004
)
1
,
pp. 77-82
Persistent link: https://www.econbiz.de/10006610392
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