CHAUDHRI, M. M.; KHAYYAT, M. M. O.; HASKO, D. G. - In: Surface Review and Letters (SRL) 14 (2007) 04, pp. 719-723
Raman spectroscopy, which is a non-destructive technique, has been used to investigate the effect of sample temperature on indentation-induced crystallographic phase transitions in crystalline silicon and amorphous silicon films deposited on a sapphire crystal. It has been shown that in both...